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--- documentation:post_modifications [2011/12/30 21:02] – 93.231.167.59
+++ documentation:post_modifications [2013/04/03 22:21] (current) – external edit 127.0.0.1
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+One data point for one film can be characterized by the four numbers qz, energy, intensity and type of polarization.
+Dependent on the type of measurement different modifications could be helpful to analyze the data. The program is capable to do this modifications automatically.
+== Multiply by *qz^4 ==
+The two main effects in reflectometry are the reflection and transmission at the interfaces (fresnel equations) and interference.
+If you neglect the roughness at the interface the fresnel part is proportional to 1 / qz^4.
+Therefore by multiplying the result by qz^4 one can emerge the interference part of the result.
+(TODO: Fit linear if this option is enabled)
+== Divide by /cos(2*theta)^2 if pi-light ==
+The Fresnel formulas between sigma and pi light differ by a factor /cos(2*theta)^2. If you want to compare the dichroism between sigma- and pi-light you can enable this option.
+== Fourier transformation ==
+ Fourier transforms the spectra to determine the layer thicknesses.
+== Averaging ==
+ TODO \\