remagx
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| + | ====== ReMagX ====== | ||
| + | ===== About ===== | ||
| + | {{: | ||
| + | ReMagX is a scientific software to calculate and fit the specular x-ray | ||
| + | reflection from a thin film sample taking into account magnetic | ||
| + | contributions. | ||
| + | |||
| + | The program is able to simulate standard non-magnetic x-ray reflectivity | ||
| + | for variable energies based upon the so called Parratt formalism. | ||
| + | However, the real aim and strength of ReMagX is the simulation of the | ||
| + | reflectivity from a magnetic multilayer under circular polarized x-rays. | ||
| + | By calculating the specular reflection of a transition metal sample, e.g. | ||
| + | Co/Cu multilayer, at the L-edge of Co and taking into account variations | ||
| + | in the reflectivity based upon the XMCD effect a dichroic reflectometry | ||
| + | is available. | ||
| + | |||
| + | |||
| + | |||
| + | ===== Motivation ===== | ||
| + | |||
| + | Materials composed of several thin layers, so called multilayers, | ||
| + | great scientific interest. The reduced dimensionality and/or the existence | ||
| + | f many interfaces can lead to novel physical phenomena. Magnetic functional | ||
| + | materials and films are of interest for data storage devices such as hard | ||
| + | disks, read heads and sensors. | ||
| + | X-ray resonant reflectometry (XRR) is the ideal tool to study the depth | ||
| + | resolved and element-specific electronic structure of multilayers. | ||
| + | Besides of the structural parameters of the thin film like thickness and | ||
| + | roughness one is sensitive to the optical constants which includes effects like | ||
| + | magnetic profiles, element density profiles, electronic reconstruction and strain effects. | ||
| + | |||
| + | To investigate the magnetism in such systems, | ||
| + | a techniqe able to probe the local magnetic moments in an element selective | ||
| + | way is desirable. X-ray Magnetic Reflectometry is such a technique. By making | ||
| + | use of the x-ray magnetic circular dichroism (XMCD) as additional contrast for | ||
| + | standard x-ray reflectivity a method is available to probe chemical and magnetic | ||
| + | depth profiles of thin films. | ||
| + | |||
| + | |||
| + | ===== Features ===== | ||
| + | * Three different algorithms for reflectivity simulation for optical isotropic and anisotropic media (Parratt/ | ||
| + | * Graphical User Interface | ||
| + | * Sample definition either as compound-profile or elemental-profile\\ | ||
| + | * Script language for maximum flexibility\\ | ||
| + | * Parallelized algorithms for best performance\\ | ||
| + | * Adaptive slicing/ | ||
| + | * Internal database of refractive index for off-resonant scattering \\ | ||
| + | * Processes optical-constant database files for maximum flexibility\\ | ||
| + | * Variable x-ray polarizations and polarization filters\\ | ||
| + | * Magnetism on a per-layer base or by introducing artificial magnetic moments\\ | ||
| + | * Simulation of Tranmission \\ | ||
| + | * Four different fit routines (Simplex, Genetic Algorithm, Levenberg-Marquardt, | ||
| + | * Map calculation module \\ | ||
| + | * Four different numerical precision modes \\ | ||
| + | * Data import modul \\ | ||
| + | * A fast summary of all measurements keeps you track the running fit \\ | ||
| + | |||
| + | |||
| + | ===== Read More ===== | ||
| + | |||
| + | * [[News|News]] | ||
| + | * [[Changes|Changelog]] | ||
| + | * [[Wanted Features|Feature Request]] | ||
| + | * [[Bug Report|Bug Report]] | ||
| + | * [[Disclaimer|Downloads]] | ||
| + | * [[Screenshots|Screenshots]] | ||
| + | * [[Documentation: | ||
| + | * [[References|References]] | ||
| + | * [[Publications|Publications]] | ||
| + | * [[How To Cite|How To Cite]] | ||
| + | * [[Links|Links]] | ||
| + | * [[Authors|Contact]] | ||
| + | * [[Copyright|Copyright]] | ||
| + | * [[https:// | ||
| + | |||
| + | |||
| + | ---- | ||